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Toshiki Yamagata
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Specimen inspection automation system
Patent number
11,209,450
Issue date
Dec 28, 2021
HITACHI HIGH-TECH CORPORATION
Kohei Kinugawa
G01 - MEASURING TESTING
Information
Patent Grant
Plug processing device and specimen test automation system includin...
Patent number
11,061,044
Issue date
Jul 13, 2021
HITACHI HIGH-TECH CORPORATION
Toshiki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Specimen inspection automation system
Patent number
10,684,302
Issue date
Jun 16, 2020
HITACHI HIGH-TECH CORPORATION
Shigeki Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Specimen conveyance device and specimen processing system
Patent number
10,613,107
Issue date
Apr 7, 2020
Hitachi High-Technologies Corporation
Toshiki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Specimen container inclination correction mechanism, and method for...
Patent number
10,551,398
Issue date
Feb 4, 2020
Hitachi High-Technologies Corporation
Kazuma Tamura
G01 - MEASURING TESTING
Information
Patent Grant
Plug application and removal device and sample processing device
Patent number
9,630,181
Issue date
Apr 25, 2017
Hitachi High-Technologies Corporation
Yoshihiro Nagaoka
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Automatic analysis system
Patent number
9,535,081
Issue date
Jan 3, 2017
Hitachi High-Technologies Corporation
Toshiki Yamagata
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Cap opening and closing mechanism and automatic analyzer including...
Patent number
9,505,507
Issue date
Nov 29, 2016
Hitachi High-Technologies Corporation
Toshiki Yamagata
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Automatic analysis system with removal, tracking, and mounting of s...
Patent number
8,834,814
Issue date
Sep 16, 2014
Hitachi High-Technologies Corporation
Toshiki Yamagata
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
THERMAL CYCLER AND GENETIC INSPECTION APPARATUS
Publication number
20240033741
Publication date
Feb 1, 2024
HITACHI HIGH-TECH CORPORATION
Nobuyuki ISOSHIMA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Biochemical Analysis Device, Reaction Unit, and Cassette Guide
Publication number
20240033745
Publication date
Feb 1, 2024
Hitachi High-Tech Corporation
Bohao CHENG
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Automatic Analysis Device
Publication number
20230366901
Publication date
Nov 16, 2023
Hitachi High-Tech Corporation
Yoko MAKINO
G01 - MEASURING TESTING
Information
Patent Application
CASSETTE STAND, REACTION UNIT, AND GENETIC TESTING APPARATUS
Publication number
20230347352
Publication date
Nov 2, 2023
HITACHI HIGH-TECH CORPORATION
Bohao CHENG
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
DISPENSING DEVICE AND METHOD
Publication number
20230314455
Publication date
Oct 5, 2023
HITACHI HIGH-TECH CORPORATION
Daisuke HARA
G01 - MEASURING TESTING
Information
Patent Application
THERMAL CYCLER AND REAL-TIME PCR DEVICE INCLUDING SAME
Publication number
20210237089
Publication date
Aug 5, 2021
HITACHI HIGH-TECH CORPORATION
Hayato SHIMIZU
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Dispensing Device, Tip Mounting Method, and Tip Removing Method
Publication number
20200341022
Publication date
Oct 29, 2020
Hitachi High-Tech Corporation
Masashi SHIBAHARA
G01 - MEASURING TESTING
Information
Patent Application
Plug Processing Device and Specimen Test Automation System Includin...
Publication number
20190310276
Publication date
Oct 10, 2019
Hitachi High-Technologies Corporation
Toshiki YAMAGATA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SPECIMEN INSPECTION AUTOMATION SYSTEM
Publication number
20190101558
Publication date
Apr 4, 2019
Hitachi High-Technologies Corporation
Kohei KINUGAWA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN INSPECTION AUTOMATION SYSTEM
Publication number
20180246131
Publication date
Aug 30, 2018
Hitachi High-Technologies Corporation
Shigeki YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN CONTAINER INCLINATION CORRECTION MECHANISM, AND METHOD FOR...
Publication number
20180120339
Publication date
May 3, 2018
Hitachi High-Technologies Corporation
Kazuma TAMURA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN CONVEYANCE DEVICE AND SPECIMEN PROCESSING SYSTEM
Publication number
20180074085
Publication date
Mar 15, 2018
Hitachi High-Technologies Corporation
Toshiki YAMAGATA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS SYSTEM
Publication number
20140314623
Publication date
Oct 23, 2014
Hitachi High-Technologies Corporation
Toshiki Yamagata
G01 - MEASURING TESTING
Information
Patent Application
PLUG APPLICATION AND REMOVAL DEVICE AND SAMPLE PROCESSING DEVICE
Publication number
20140212344
Publication date
Jul 31, 2014
Hitachi High-Technologies Corporation
Yoshihiro Nagaoka
G01 - MEASURING TESTING
Information
Patent Application
CAP OPENING AND CLOSING MECHANISM AND AUTOMATIC ANALYZER INCLUDING...
Publication number
20140174028
Publication date
Jun 26, 2014
Hitachi High-Technologies Corporation
Toshiki Yamagata
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS SYSTEM
Publication number
20130305846
Publication date
Nov 21, 2013
Hitachi High-Technologies Corporation
Toshiki Yamagata
G01 - MEASURING TESTING