Toshiki Yamane

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Image processing and inspection system
- Patent number 7,145,595
- Issue date Dec 5, 2006
- Matsushita Electric Works, Ltd.
- Toshiki Yamane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing inspection apparatus
- Patent number 6,920,180
- Issue date Jul 19, 2005
- Matsushita Electric Works, Ltd.
- Toshiki Yamane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing inspection apparatus
- Patent number 5,875,004
- Issue date Feb 23, 1999
- Matsushita Electric Works, Ltd.
- Toshiki Yamane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measurement system for determination of an object's profile...
- Patent number 5,351,126
- Issue date Sep 27, 1994
- Matsushita Electric Works, Ltd.
- Yuji Takada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Image processing and inspection system
- Publication number 20040061778
- Publication date Apr 1, 2004
- Toshiki Yamane
- G06 - COMPUTING CALCULATING COUNTING