Toshimasa Tomoda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image display system
- Patent number 6,337,724
- Issue date Jan 8, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshio Itoh
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method and apparatus for image generation
- Patent number 5,864,374
- Issue date Jan 26, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Toshio Ito
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of manufacturing a spatial frequency filter for use in a pat...
- Patent number 5,379,150
- Issue date Jan 3, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thin film forming apparatus
- Patent number 5,305,366
- Issue date Apr 19, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Takehiko Nakahara
- G01 - MEASURING TESTING
Information Patent Grant
Pattern defect detection device and a spatial frequency filter used...
- Patent number 5,289,260
- Issue date Feb 22, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device for detecting defects in a periodic pattern on a...
- Patent number 5,170,063
- Issue date Dec 8, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fine-particle measuring apparatus
- Patent number 5,030,842
- Issue date Jul 9, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Masao Koshinaka
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting minute particles on or above a substrate
- Patent number 5,008,558
- Issue date Apr 16, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Masao Koshinaka
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus employing radiation
- Patent number 4,885,759
- Issue date Dec 5, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Toshimasa Tomoda
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging an object by ultrasonic or electromagnetic waves
- Patent number 4,841,489
- Issue date Jun 20, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Yoshihiko Ozaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for radiation analysis
- Patent number 4,817,122
- Issue date Mar 28, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Badono
- G01 - MEASURING TESTING
Information Patent Grant
Metering choke
- Patent number 4,788,852
- Issue date Dec 6, 1988
- Petro-Canada Inc.
- Wallace W. Martin
- G01 - MEASURING TESTING
Information Patent Grant
System for making standard deviations in quantum noise constant thr...
- Patent number 4,785,409
- Issue date Nov 15, 1988
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Badono
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Gamma ray compensation-type neutron ionization chamber
- Patent number 4,682,036
- Issue date Jul 21, 1987
- Japan Atomic Energy Research Institute
- Naoaki Wakayama
- G01 - MEASURING TESTING
Information Patent Grant
Methods of improving radiation resistant characteristic of BF.sub.3...
- Patent number 4,587,429
- Issue date May 6, 1986
- Mitsubishi Denki Kabushiki Kaisha
- Toshimasa Tomoda
- G01 - MEASURING TESTING
Information Patent Grant
Neutron detector for use within nuclear reactor
- Patent number 4,410,483
- Issue date Oct 18, 1983
- Mitsubishi Denki Kabushiki Kaisha
- Toshimasa Tomoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization chamber having coaxially arranged cylindrical electrodes
- Patent number 4,379,248
- Issue date Apr 5, 1983
- Mitsubishi Denki Kabushiki Kaisha
- Naoki Wakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gamma-ray compensated ionization chamber
- Patent number 4,302,696
- Issue date Nov 24, 1981
- Mitsubishi Denki Kabushiki Kaisha
- Naoaki Wakayama
- H01 - BASIC ELECTRIC ELEMENTS

Toshimasa Tomoda

Person

Patents Grantslast 30 patents

Image display system

Method and apparatus for image generation

Method of manufacturing a spatial frequency filter for use in a pat...

Thin film forming apparatus

Pattern defect detection device and a spatial frequency filter used...

Inspection device for detecting defects in a periodic pattern on a...

Fine-particle measuring apparatus

System for detecting minute particles on or above a substrate

Measurement apparatus employing radiation

Method of imaging an object by ultrasonic or electromagnetic waves

Apparatus for radiation analysis

Metering choke

System for making standard deviations in quantum noise constant thr...

Gamma ray compensation-type neutron ionization chamber

Methods of improving radiation resistant characteristic of BF.sub.3...

Neutron detector for use within nuclear reactor

Ionization chamber having coaxially arranged cylindrical electrodes

Gamma-ray compensated ionization chamber