Toshimitsu Hamada

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Process management system
- Patent number 6,757,621
- Issue date Jun 29, 2004
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Process control system
- Patent number 6,542,830
- Issue date Apr 1, 2003
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
System for quality control where inspection frequency of inspection...
- Patent number 6,002,989
- Issue date Dec 14, 1999
- Hitachi, Ltd.
- Masataka Shiba
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for inspection of solder joints by x-ray fluor...
- Patent number 5,493,594
- Issue date Feb 20, 1996
- Hitachi, Ltd.
- Toshimitsu Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method for soldered joints using x-ray imaging and appar...
- Patent number 5,463,667
- Issue date Oct 31, 1995
- Hitachi, Ltd.
- Toshiaki Ichinose
- G01 - MEASURING TESTING
Information Patent Grant
Method of aligning and bonding tab inner leads
- Patent number 5,059,559
- Issue date Oct 22, 1991
- Hitachi, Ltd.
- Michio Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting filled state of via-holes filled with fillers...
- Patent number 5,015,097
- Issue date May 14, 1991
- Hitachi, Ltd.
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray tomographic imaging system and method
- Patent number 4,872,187
- Issue date Oct 3, 1989
- Hitachi, Ltd.
- Kozo Nakahata
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method
- Patent number 4,776,023
- Issue date Oct 4, 1988
- Hitachi, Ltd.
- Toshimitsu Hamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting soldered portions
- Patent number 4,772,125
- Issue date Sep 20, 1988
- Hitachi, Ltd.
- Kazushi Yoshimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern test apparatus including a plurality of pattern generators
- Patent number 4,744,047
- Issue date May 10, 1988
- Hitachi, Ltd.
- Keiichi Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting edge of fine pattern on specimen
- Patent number 4,556,797
- Issue date Dec 3, 1985
- Hitachi, Ltd.
- Asahiro Kuni
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for appearance inspection
- Patent number 4,410,278
- Issue date Oct 18, 1983
- Hitachi, Ltd.
- Hiroshi Makihira
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection system
- Patent number 4,403,294
- Issue date Sep 6, 1983
- Hitachi, Ltd.
- Toshimitsu Hamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for detecting the position of an object
- Patent number 4,291,334
- Issue date Sep 22, 1981
- Hitachi, Ltd.
- Michihiro Mese
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cylindrical body appearance inspection apparatus
- Patent number 4,226,539
- Issue date Oct 7, 1980
- Hitachi, Ltd.
- Yasuo Nakagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface detect test apparatus
- Patent number 4,162,126
- Issue date Jul 24, 1979
- Hitachi, Ltd.
- Yasuo Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Variable thresholding circuit for converting an analog signal to a...
- Patent number 4,109,211
- Issue date Aug 22, 1978
- Hitachi, Ltd.
- Michihiro Mese
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Process management system
- Publication number 20030130806
- Publication date Jul 10, 2003
- Hitachi, Ltd
- Fumio Mizuno
- G01 - MEASURING TESTING

Toshimitsu Hamada

Person

Patents Grantslast 30 patents

Process management system

Process control system

System for quality control where inspection frequency of inspection...

Method and apparatus for inspection of solder joints by x-ray fluor...

Inspection method for soldered joints using x-ray imaging and appar...

Method of aligning and bonding tab inner leads

Method for inspecting filled state of via-holes filled with fillers...

X-ray tomographic imaging system and method

Pattern inspection method

Apparatus and method for inspecting soldered portions

Pattern test apparatus including a plurality of pattern generators

Method and apparatus for detecting edge of fine pattern on specimen

Method and apparatus for appearance inspection

Surface defect inspection system

System for detecting the position of an object

Cylindrical body appearance inspection apparatus

Surface detect test apparatus

Variable thresholding circuit for converting an analog signal to a...

Patents Applicationslast 30 patents

Process management system