Toshinaga TAKEYA

Follow

Person

Aomori, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement system and measurement method
- Patent number 11,971,296
- Issue date Apr 30, 2024
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe, optical probe array, test system and test method
- Patent number 11,624,679
- Issue date Apr 11, 2023
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing probe card
- Patent number 9,015,935
- Issue date Apr 28, 2015
- Kabushiki Kaisha Nihon Micronics
- Toshinaga Takeya
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing probe card
- Patent number 9,015,934
- Issue date Apr 28, 2015
- Kabushiki Kaisha Nihon Micronics
- Toshinaga Takeya
- G01 - MEASURING TESTING
Information Patent Grant
Contact for electrical test of electronic devices, probe assembly a...
- Patent number 8,063,651
- Issue date Nov 22, 2011
- Kabushiki Kaisha Nihon Micronics
- Shoji Kamata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20220196570
- Publication date Jun 23, 2022
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20220034714
- Publication date Feb 3, 2022
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROBE, OPTICAL PROBE ARRAY, TEST SYSTEM AND TEST METHOD
- Publication number 20210102864
- Publication date Apr 8, 2021
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING PROBE CARD
- Publication number 20120042509
- Publication date Feb 23, 2012
- Kabushiki Kaisha Nihon Micronics
- Toshinaga TAKEYA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING PROBE CARD
- Publication number 20120042516
- Publication date Feb 23, 2012
- Kabushiki Kaisha Nihon Micronics
- Toshinaga TAKEYA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT FOR ELECTRICAL TEST OF ELECTRONIC DEVICES, METHOD FOR MANUF...
- Publication number 20090273357
- Publication date Nov 5, 2009
- Kabushiki Kaisha Nihon Micronics
- Shoji Kamata
- G01 - MEASURING TESTING