Toshinobu Nakao

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scan test control method and scan test circuit
- Patent number 7,155,649
- Issue date Dec 26, 2006
- Matsushita Electric Industrial Co., Ltd.
- Toshinobu Nakao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scan test control method and scan test circuit
- Publication number 20040181723
- Publication date Sep 16, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Toshinobu Nakao
- G01 - MEASURING TESTING