Toshinobu Otsubo

Person

Atsugi-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Delay time measurement apparatus for optical element
- Patent number 6,788,410
- Issue date Sep 7, 2004
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Optical sampling waveform measuring apparatus aiming at achieving w...
- Patent number 6,720,548
- Issue date Apr 13, 2004
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Sum frequency light generation method and sum frequency light gener...
- Patent number 6,697,395
- Issue date Feb 24, 2004
- Anritsu Corporation
- Akihito Otani
- G02 - OPTICS
Information Patent Grant
Waveform measuring method and apparatus
- Patent number 6,677,577
- Issue date Jan 13, 2004
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Waveform measuring apparatus
- Patent number 6,483,287
- Issue date Nov 19, 2002
- Anritsu Corporation
- Toshinobu Otsubo
- G01 - MEASURING TESTING
Information Patent Grant
Pulse generator
- Patent number 6,483,362
- Issue date Nov 19, 2002
- Anritsu Corporation
- Akihito Otani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Optical pulse generation system for generating optical pulses havin...
- Patent number 6,483,624
- Issue date Nov 19, 2002
- Anritsu Corporation
- Akihito Otani
- G02 - OPTICS
Information Patent Grant
Waveform measuring apparatus
- Patent number 6,407,686
- Issue date Jun 18, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Complementary optical sampling waveform measuring apparatus and pol...
- Patent number 6,154,309
- Issue date Nov 28, 2000
- Anritsu Corporation
- Akihito Otani
- G02 - OPTICS
Information Patent Grant
Wavelength dispersion measuring apparatus and polarization dispersi...
- Patent number 5,995,228
- Issue date Nov 30, 1999
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical sampling waveform measuring apparatus aiming at achieving w...
- Publication number 20020139924
- Publication date Oct 3, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Application
Sum frequency light generation method and sum frequency light gener...
- Publication number 20020141459
- Publication date Oct 3, 2002
- Anritsu Corporation
- Akihito Otani
- G02 - OPTICS
Information Patent Application
Waveform measuring apparatus
- Publication number 20020024458
- Publication date Feb 28, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Application
Waveform measuring method and apparatus
- Publication number 20020024002
- Publication date Feb 28, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Application
Pulse generator
- Publication number 20020021160
- Publication date Feb 21, 2002
- Anritsu Corporation
- Akihito Otani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Waveform measuring apparatus
- Publication number 20020017901
- Publication date Feb 14, 2002
- Anritsu Corporation
- Toshinobu Otsubo
- G01 - MEASURING TESTING

Toshinobu Otsubo

Person

Patents Grantslast 30 patents

Delay time measurement apparatus for optical element

Optical sampling waveform measuring apparatus aiming at achieving w...

Sum frequency light generation method and sum frequency light gener...

Waveform measuring method and apparatus

Waveform measuring apparatus

Pulse generator

Optical pulse generation system for generating optical pulses havin...

Waveform measuring apparatus

Complementary optical sampling waveform measuring apparatus and pol...

Wavelength dispersion measuring apparatus and polarization dispersi...

Patents Applicationslast 30 patents

Optical sampling waveform measuring apparatus aiming at achieving w...

Sum frequency light generation method and sum frequency light gener...

Waveform measuring apparatus

Waveform measuring method and apparatus

Pulse generator

Waveform measuring apparatus