Toshinori Inoshita

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test apparatus
- Patent number 6,691,271
- Issue date Feb 10, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Yusuke Kanehira
- G01 - MEASURING TESTING
Information Patent Grant
Logic circuit verification apparatus and method for semiconductor i...
- Patent number 6,170,072
- Issue date Jan 2, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Moriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Logic circuit verification device for semiconductor integrated circuit
- Patent number 6,088,821
- Issue date Jul 11, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Moriguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for rapid simulation of logic circuits
- Patent number 6,072,948
- Issue date Jun 6, 2000
- Mitsubishi Electric System Lsi Design Corporation
- Tetsuo Saitoh
- G06 - COMPUTING CALCULATING COUNTING