Toshinori Maeda

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and system LSI having a test expec...
- Patent number 7,739,571
- Issue date Jun 15, 2010
- Panasonic Corporation
- Yasuteru Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Error correction device
- Patent number 6,986,095
- Issue date Jan 10, 2006
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for error correction
- Patent number 6,738,947
- Issue date May 18, 2004
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for error correction
- Patent number 6,697,989
- Issue date Feb 24, 2004
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G11 - INFORMATION STORAGE
Information Patent Grant
Error detective information adding equipment
- Patent number 6,253,349
- Issue date Jun 26, 2001
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory exclusive control device and method therefor
- Patent number 6,233,663
- Issue date May 15, 2001
- Matsushita Electric Industrial Co., Ltd.
- Kazushi Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for operating input, processing and output units in parallel...
- Patent number 6,041,368
- Issue date Mar 21, 2000
- Matsushita Electric Industrial, Co.
- Fumio Nakatsuji
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit and test method of integrated semiconductor device
- Patent number 5,631,913
- Issue date May 20, 1997
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G11 - INFORMATION STORAGE
Information Patent Grant
Device for and method of evaluating semiconductor integrated circuit
- Patent number 5,598,100
- Issue date Jan 28, 1997
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Clock generator and method for generating a clock
- Patent number 5,548,249
- Issue date Aug 20, 1996
- Matsushita Electric Industrial Co., Ltd.
- Masaya Sumita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device for and method of evaluating semiconductor integrated circuit
- Patent number 5,504,431
- Issue date Apr 2, 1996
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Microprocessor system generating instruction fetch addresses at hig...
- Patent number 5,349,671
- Issue date Sep 20, 1994
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Integrated Circuit and System Lsi
- Publication number 20080141089
- Publication date Jun 12, 2008
- Yasuteru Maeda
- G01 - MEASURING TESTING
Information Patent Application
Error correction device
- Publication number 20060069977
- Publication date Mar 30, 2006
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Maeda
- G11 - INFORMATION STORAGE
Information Patent Application
Error correction device
- Publication number 20020166090
- Publication date Nov 7, 2002
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Toshinori Maeda
- G11 - INFORMATION STORAGE
Information Patent Application
Data transfer apparatus and data transfer method
- Publication number 20020004881
- Publication date Jan 10, 2002
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yukio Iijima
- G06 - COMPUTING CALCULATING COUNTING

Toshinori Maeda

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit and system LSI having a test expec...

Error correction device

Method and apparatus for error correction

Method and apparatus for error correction

Error detective information adding equipment

Memory exclusive control device and method therefor

System for operating input, processing and output units in parallel...

Test circuit and test method of integrated semiconductor device

Device for and method of evaluating semiconductor integrated circuit

Clock generator and method for generating a clock

Device for and method of evaluating semiconductor integrated circuit

Microprocessor system generating instruction fetch addresses at hig...

Patents Applicationslast 30 patents

Semiconductor Integrated Circuit and System Lsi

Error correction device

Error correction device

Data transfer apparatus and data transfer method