Toshio Ando

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Kanazawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and molecular structure change observatio...
- Patent number 7,556,968
- Issue date Jul 7, 2009
- Kanazawa University Kanazawa-shi
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit and scanning microscope having the same
- Patent number 6,809,306
- Issue date Oct 26, 2004
- Olympus Optical Co., Ltd.
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit and scanning microscope having the same
- Patent number 6,617,761
- Issue date Sep 9, 2003
- Olympus Optical Co, Ltd.
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Grant
Probe scanning mechanism for a scanning probe microscope
- Patent number 6,118,121
- Issue date Sep 12, 2000
- Olympus Optical Co., Ltd.
- Toshio Ando
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe scanning mechanism for a scanning probe microscope
- Patent number 5,912,461
- Issue date Jun 15, 1999
- Olympus Optical Co., Ltd.
- Toshio Ando
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Scanning probe microscope and molecular structure change observatio...
- Publication number 20050247874
- Publication date Nov 10, 2005
- KANAZAWA UNIVERSITY
- Toshio Ando
- G02 - OPTICS
Information Patent Application
Scanning unit and scanning microscope having the same
- Publication number 20040065819
- Publication date Apr 8, 2004
- Olympus Optical Co., Ltd.
- Toshio Ando
- G02 - OPTICS
Information Patent Application
Scanning unit and scanning microscope having the same
- Publication number 20020017615
- Publication date Feb 14, 2002
- Olympus Optical Co., Ltd.
- Toshio Ando
- B82 - NANO-TECHNOLOGY