Toshio Ando

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Ishikawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanner device for scanning probe microscope
- Patent number 8,217,367
- Issue date Jul 10, 2012
- National University Corporation Kanazawa University
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scan type probe microscope
- Patent number 8,065,908
- Issue date Nov 29, 2011
- National University Corporation Kanazawa University
- Takayuki Uchihashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 7,975,315
- Issue date Jul 5, 2011
- National University Corporation Kanazawa University
- Toshio Ando
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and active damping drive control device
- Patent number 7,975,314
- Issue date Jul 5, 2011
- National University Corporation Kanazawa University
- Toshio Ando
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scan type probe microscope and cantilever drive device
- Patent number 7,958,565
- Issue date Jun 7, 2011
- National University Corporation Kanazawa University
- Toshio Ando
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 7,954,165
- Issue date May 31, 2011
- National University Corporation Kanazawa University
- Toshio Ando
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCANNER DEVICE FOR SCANNING PROBE MICROSCOPE
- Publication number 20110093989
- Publication date Apr 21, 2011
- Takeshi Fukuma
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE
- Publication number 20100024082
- Publication date Jan 28, 2010
- National University Corporation Kanazawa University
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Application
SCAN TYPE PROBE MICROSCOPE AND CANTILEVER DRIVE DEVICE
- Publication number 20090313729
- Publication date Dec 17, 2009
- National University Corporation Kanazawa University
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND ACTIVE DAMPING DRIVE CONTROL DEVICE
- Publication number 20090276924
- Publication date Nov 5, 2009
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20090133168
- Publication date May 21, 2009
- National University Corporation Kanazawa University
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Application
Scan Type Probe Microscope
- Publication number 20080307864
- Publication date Dec 18, 2008
- National University Corporation Kanazawa University
- Takayuki Uchihashi
- G01 - MEASURING TESTING