Toshio Asano

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Non-destructive inspection method and apparatus therefor
- Patent number 7,462,827
- Issue date Dec 9, 2008
- Hitachi-GE Nuclear Energy, Ltd.
- Toshio Asano
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspection method and apparatus
- Patent number 7,215,807
- Issue date May 8, 2007
- Hitachi, Ltd.
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for non-destructive testing
- Patent number 6,975,391
- Issue date Dec 13, 2005
- Hitachi, Ltd.
- Toshio Asano
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspection method and apparatus
- Patent number 6,950,545
- Issue date Sep 27, 2005
- Hitachi, Ltd.
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting a defect in a pixel of an electrical display u...
- Patent number 6,831,995
- Issue date Dec 14, 2004
- Hitachi, Ltd.
- Toshio Asano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image display device and its repairing method and apparatus
- Patent number 6,693,699
- Issue date Feb 17, 2004
- Hitachi, Ltd.
- Takashi Inoue
- G02 - OPTICS
Information Patent Grant
Image display device and its repairing method and apparatus
- Patent number 6,552,771
- Issue date Apr 22, 2003
- Hitachi, Ltd.
- Takashi Inoue
- G02 - OPTICS
Information Patent Grant
Method and apparatus for checking defect on display screen
- Patent number 5,319,459
- Issue date Jun 7, 1994
- Hitachi, Ltd.
- Jun Mochizuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Picture quality testing method and apparatus for color cathode-ray...
- Patent number 4,963,828
- Issue date Oct 16, 1990
- Hitachi, Ltd.
- Keisuke Kawame
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inserting electronic elements
- Patent number 4,586,247
- Issue date May 6, 1986
- Hitachi, Ltd.
- Toshiaki Murai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Non-destructive inspection method and apparatus therefor
- Publication number 20060033986
- Publication date Feb 16, 2006
- Toshio Asano
- G01 - MEASURING TESTING
Information Patent Application
Nondestructive inspection method and apparatus
- Publication number 20050259861
- Publication date Nov 24, 2005
- Hitachi, Ltd
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image display device and its repairing method and apparatus
- Publication number 20030002008
- Publication date Jan 2, 2003
- Takashi Inoue
- G02 - OPTICS

Toshio Asano

Person

Patents Grantslast 30 patents

Non-destructive inspection method and apparatus therefor

Nondestructive inspection method and apparatus

Method and apparatus for non-destructive testing

Nondestructive inspection method and apparatus

Method for detecting a defect in a pixel of an electrical display u...

Image display device and its repairing method and apparatus

Image display device and its repairing method and apparatus

Method and apparatus for checking defect on display screen

Picture quality testing method and apparatus for color cathode-ray...

Apparatus for inserting electronic elements

Patents Applicationslast 30 patents

Non-destructive inspection method and apparatus therefor

Nondestructive inspection method and apparatus

Image display device and its repairing method and apparatus