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Toshio Goto
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Kumagaya, JP
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last 30 patents
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Patent Grant
Semiconductor device testing apparatus
Patent number
6,104,204
Issue date
Aug 15, 2000
Advantest Corporation
Hisao Hayama
G01 - MEASURING TESTING
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Patent Grant
Semiconductor device testing apparatus
Patent number
5,969,537
Issue date
Oct 19, 1999
Advantest Corporation
Yukio Kanno
G01 - MEASURING TESTING