Toshio Hayashida

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Omura, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring liquid level in single crystal pulling apparat...
- Patent number 8,361,223
- Issue date Jan 29, 2013
- Sumco Techxiv Corporation
- Toshio Hayashida
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Position measuring method
- Patent number 8,130,386
- Issue date Mar 6, 2012
- Sumco Techxiv Corporation
- Toshio Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring device and position measuring method in semicond...
- Patent number 8,115,908
- Issue date Feb 14, 2012
- Sumco Techxiv Corporation
- Toshio Hayashida
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method and apparatus for measuring melt level
- Patent number 6,994,748
- Issue date Feb 7, 2006
- Komatsu Denshi Kinzoku Kabushiki Kaisha
- Masato Moriya
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING LIQUID LEVEL IN SINGLE CRYSTAL PULLING APPARAT...
- Publication number 20110114010
- Publication date May 19, 2011
- Toshio Hayashida
- C30 - CRYSTAL GROWTH
Information Patent Application
POSITION MEASURING DEVICE AND POSITION MEASURING METHOD IN SEMICOND...
- Publication number 20100165321
- Publication date Jul 1, 2010
- Toshio Hayashida
- C30 - CRYSTAL GROWTH
Information Patent Application
Method and apparatus for measuring melt level
- Publication number 20030116729
- Publication date Jun 26, 2003
- Masato Moriya
- C30 - CRYSTAL GROWTH