Toshio Hiyoshi

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Sagamihara-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of and apparatus for measuring elongation of a test specimen
- Patent number 6,460,418
- Issue date Oct 8, 2002
- Kishimoto Sangyo Co., Ltd.
- Toshio Hiyoshi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF AND APPARATUS FOR MEASURING ELONGATION OF A TEST SPECIMEN
- Publication number 20020166386
- Publication date Nov 14, 2002
- KISHIMOTO SANGYO CO., LTD
- Toshio Hiyoshi
- G01 - MEASURING TESTING