Toshio Ishiyama

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Fault diagnosis method and system for a sequential circuit
- Patent number 6,397,362
- Issue date May 28, 2002
- NEC Corporation
- Toshio Ishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Estimation of failure section region with small simulation calculat...
- Patent number 5,968,195
- Issue date Oct 19, 1999
- NEC Corporation
- Toshio Ishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Fault diagnosis method for a sequential circuit
- Patent number 5,640,403
- Issue date Jun 17, 1997
- NEC Corporation
- Toshio Ishiyama
- G01 - MEASURING TESTING