Toshio Kanoh

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device for optically measuring aspheric surface
- Patent number 4,743,117
- Issue date May 10, 1988
- Ricoh Company, Ltd.
- Junichi Kitabayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting origin of shear and measuring amount of shear i...
- Patent number 4,743,118
- Issue date May 10, 1988
- Ricoh Company, Ltd.
- Keishin Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Fringe scanning shearing interferometer
- Patent number 4,643,576
- Issue date Feb 17, 1987
- Ricoh Company Ltd.
- Toshio Kanoh
- G01 - MEASURING TESTING