Toshio Kodama

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Ion beam device and ion beam processing method, and holder member
- Patent number 7,297,944
- Issue date Nov 20, 2007
- SII NanoTechnology Inc.
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam device and ion beam processing method
- Patent number 7,276,691
- Issue date Oct 2, 2007
- SII NanoTechnology Inc.
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam apparatus, ion beam processing method and sample holder me...
- Patent number 6,838,685
- Issue date Jan 4, 2005
- SII NanoTechnology Inc.
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring film thickness
- Patent number 6,489,612
- Issue date Dec 3, 2002
- Seiko Instruments Inc.
- Toshio Kodama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ion beam device and ion beam processing method
- Publication number 20060163497
- Publication date Jul 27, 2006
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Application
Ion beam device and ion beam processing method, and holder member
- Publication number 20050236587
- Publication date Oct 27, 2005
- Toshio Kodama
- G01 - MEASURING TESTING