Toshio Miyatake

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Chiyoda, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe structure
- Patent number 6,977,514
- Issue date Dec 20, 2005
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and test device for same
- Patent number 6,885,208
- Issue date Apr 26, 2005
- Renesas Technology Corp.
- Toshio Miyatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Packaging device for holding a plurality of semiconductor devices t...
- Patent number 6,864,568
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,774,654
- Issue date Aug 10, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure
- Patent number 6,614,246
- Issue date Sep 2, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,496,023
- Issue date Dec 17, 2002
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing semiconductor device and apparatus usable therein
- Patent number 6,465,264
- Issue date Oct 15, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe structure
- Publication number 20040145382
- Publication date Jul 29, 2004
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...
- Publication number 20030102880
- Publication date Jun 5, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and test device for same
- Publication number 20030047731
- Publication date Mar 13, 2003
- Toshio Miyatake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Packaging device for holding a plurality of semiconductor devices t...
- Publication number 20030015779
- Publication date Jan 23, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING