Toshio Sanagawa

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Kobe, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus having a pivoted eddy current probe for detecting flaws i...
- Patent number 5,479,834
- Issue date Jan 2, 1996
- Mitsubishi Jukogyo Kabushiki Kaisha
- Toshio Sanagawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for examining tubular members disposed in axially paralle...
- Patent number 4,744,251
- Issue date May 17, 1988
- Mitsubishi Jukogyo Kabushiki Kaisha
- Isao Shirasu
- G01 - MEASURING TESTING