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Toshio Shiraiwa
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Amagasaki, JP
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last 30 patents
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Patent Grant
Fully automatic ultrasonic flaw detection apparatus
Patent number
4,294,118
Issue date
Oct 13, 1981
Sumitomo Kinzoku Kogyo Kabushiki Kaisha
Toshio Shiraiwa
B82 - NANO-TECHNOLOGY
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Patent Grant
Method and apparatus for the automatic ultrasonic flaw detection
Patent number
4,270,389
Issue date
Jun 2, 1981
Sumitomo Metal Industries Limited
Toshio Shiraiwa
G01 - MEASURING TESTING