Toshioki SHIMOJIMA

Person

Suwa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor and robot
- Patent number 11,060,890
- Issue date Jul 13, 2021
- Seiko Epson Corporation
- Toshiyuki Kamiya
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component transport apparatus and electronic component i...
- Patent number 10,416,231
- Issue date Sep 17, 2019
- Seiko Epson Corporation
- Daisuke Kirihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handler and inspection apparatus
- Patent number 9,485,810
- Issue date Nov 1, 2016
- Seiko Epson Corporation
- Takayuki Imai
- G01 - MEASURING TESTING
Information Patent Grant
Part inspection apparatus and handler
- Patent number 9,434,555
- Issue date Sep 6, 2016
- Seiko Epson Corporation
- Masami Maeda
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Handler and part inspection apparatus
- Patent number 9,411,012
- Issue date Aug 9, 2016
- Seiko Epson Corporation
- Nobuo Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Handler provided with a temperature control unit
- Patent number 9,404,693
- Issue date Aug 2, 2016
- Seiko Epson Corporation
- Masami Maeda
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Handler and part inspecting apparatus
- Patent number 9,074,728
- Issue date Jul 7, 2015
- Seiko Epson Corporation
- Masami Maeda
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS

Patents Applicationslast 30 patents

Information Patent Application
SENSOR AND ROBOT
- Publication number 20190145798
- Publication date May 16, 2019
- SEIKO EPSON CORPORATION
- Toshiyuki KAMIYA
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
ELECTRONIC COMPONENT TRANSPORT APPARATUS AND ELECTRONIC COMPONENT I...
- Publication number 20180074119
- Publication date Mar 15, 2018
- SEIKO EPSON CORPORATION
- Daisuke KIRIHARA
- G01 - MEASURING TESTING
Information Patent Application
HANDLER AND INSPECTION APPARATUS
- Publication number 20140312924
- Publication date Oct 23, 2014
- SEIKO EPSON CORPORATION
- Takayuki Imai
- G01 - MEASURING TESTING
Information Patent Application
HANDLER AND PART INSPECTING APPARATUS
- Publication number 20130206383
- Publication date Aug 15, 2013
- SEIKO EPSON CORPORATION
- Masami MAEDA
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
HANDLER AND PART INSPECTING APPARATUS
- Publication number 20130205804
- Publication date Aug 15, 2013
- SEIKO EPSON CORPORATION
- Masami MAEDA
- G01 - MEASURING TESTING
Information Patent Application
PART INSPECTION APPARATUS AND HANDLER
- Publication number 20130209199
- Publication date Aug 15, 2013
- SEIKO EPSON CORPORATION
- Masami MAEDA
- G01 - MEASURING TESTING
Information Patent Application
HANDLER AND PART INSPECTION APPARATUS
- Publication number 20130058741
- Publication date Mar 7, 2013
- SEIKO EPSON CORPORATION
- Hiroaki FUJIMORI
- G01 - MEASURING TESTING
Information Patent Application
HANDLER AND PART INSPECTION APPARATUS
- Publication number 20130057310
- Publication date Mar 7, 2013
- SEIKO EPSON CORPORATION
- Nobuo HASEGAWA
- G01 - MEASURING TESTING

Toshioki SHIMOJIMA

Person

Patents Grantslast 30 patents

Sensor and robot

Electronic component transport apparatus and electronic component i...

Handler and inspection apparatus

Part inspection apparatus and handler

Handler and part inspection apparatus

Handler provided with a temperature control unit

Handler and part inspecting apparatus

Patents Applicationslast 30 patents

SENSOR AND ROBOT

ELECTRONIC COMPONENT TRANSPORT APPARATUS AND ELECTRONIC COMPONENT I...

HANDLER AND INSPECTION APPARATUS

HANDLER AND PART INSPECTING APPARATUS

HANDLER AND PART INSPECTING APPARATUS

PART INSPECTION APPARATUS AND HANDLER

HANDLER AND PART INSPECTION APPARATUS

HANDLER AND PART INSPECTION APPARATUS