Toshiro Kurosawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Appearance inspection apparatus and projection method for projectin...
- Patent number 7,330,265
- Issue date Feb 12, 2008
- Tokyo Seimitsu Co., Ltd.
- Toshiro Kurosawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Surface Inspection Apparatus and Method of Illumination
- Publication number 20080024794
- Publication date Jan 31, 2008
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Application
Appearance inspection apparatus and projection method for projectin...
- Publication number 20060007436
- Publication date Jan 12, 2006
- Toshiro Kurosawa
- G01 - MEASURING TESTING