Toshiro Mihara

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Radiation imaging method and system
- Patent number 5,805,663
- Issue date Sep 8, 1998
- Futec, Inc.
- Toshiro Mihara
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining the surface of a continuously cast metal strip...
- Patent number 4,237,959
- Issue date Dec 9, 1980
- Futec Inc.
- Tomio Yamamoto
- G01 - MEASURING TESTING