Toshiro Sakamoto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical densitometer and optical waveguide
- Patent number 11,892,438
- Issue date Feb 6, 2024
- Asahi Kasei Microdevices Corporation
- Takaaki Furuya
- G01 - MEASURING TESTING
Information Patent Grant
Optical waveguide and optical concentration measuring apparatus whe...
- Patent number 11,686,679
- Issue date Jun 27, 2023
- Asahi Kasei Microdevices Corporation
- Toshiro Sakamoto
- G02 - OPTICS
Information Patent Grant
Optical chemical analysis apparatus
- Patent number 11,549,885
- Issue date Jan 10, 2023
- Asahi Kasei Microdevices Corporation
- Takaaki Furuya
- G01 - MEASURING TESTING
Information Patent Grant
Optical waveguide and optical concentration measuring apparatus
- Patent number 11,391,670
- Issue date Jul 19, 2022
- Asahi Kasei Microdevices Corporation
- Toshiro Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Optical waveguide, optical concentration measuring device, and meth...
- Patent number 11,353,399
- Issue date Jun 7, 2022
- Asahi Kasel Microdevices Corporation
- Toshiro Sakamoto
- G02 - OPTICS
Information Patent Grant
Optical waveguide and optical concentration measuring apparatus com...
- Patent number 11,313,796
- Issue date Apr 26, 2022
- Asahi Kasei Microdevices Corporation
- Toshiro Sakamoto
- G02 - OPTICS
Information Patent Grant
Optical waveguide and optical concentration measuring apparatus
- Patent number 11,313,797
- Issue date Apr 26, 2022
- Asahi Kasei Microdevices Corporation
- Tatsushi Yagi
- G02 - OPTICS
Information Patent Grant
Optical density measuring apparatus and optical waveguide
- Patent number 11,280,729
- Issue date Mar 22, 2022
- Asahi Kasei Microdevices Corporation
- Toshiro Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Current source with nonvolatile storage element
- Patent number 11,249,503
- Issue date Feb 15, 2022
- Asahi Kasel Microdevices Corporation
- Toshiro Sakamoto
- G05 - CONTROLLING REGULATING
Information Patent Grant
Optical density measuring apparatus and optical waveguide
- Patent number 11,209,361
- Issue date Dec 28, 2021
- Asahi Kasei Microdevices Corporation
- Toshiro Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Temperature characteristic adjustment circuit
- Patent number 11,094,687
- Issue date Aug 17, 2021
- Asahi Kasei Microdevices Corporation
- Toshiro Sakamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical waveguide and optical concentration measuring apparatus
- Patent number 10,928,318
- Issue date Feb 23, 2021
- Asahi Kasei Microdevices Corporation
- Tatsushi Yagi
- G01 - MEASURING TESTING
Information Patent Grant
Nonvolatile storage element and reference voltage generation circuit
- Patent number 10,446,567
- Issue date Oct 15, 2019
- Asahi Kasei Microdevices Corporation
- Toshiro Sakamoto
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device and manufacturing method of the same
- Patent number 9,343,554
- Issue date May 17, 2016
- Asahi Kasei Microdevices Corporation
- Toshiro Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing semiconductor device
- Patent number 9,048,252
- Issue date Jun 2, 2015
- Asahi Kasei Microdevices Corporation
- Toshiro Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,034,709
- Issue date May 19, 2015
- Asahi Kasei Microdevices Corporation
- Shogo Katsuki
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS
- Publication number 20220170855
- Publication date Jun 2, 2022
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro SAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHEMICAL ANALYSIS APPARATUS
- Publication number 20220091025
- Publication date Mar 24, 2022
- ASAHI KASEI MICRODEVICES CORPORATION
- Takaaki FURUYA
- G02 - OPTICS
Information Patent Application
OPTICAL DENSITOMETER AND OPTICAL WAVEGUIDE
- Publication number 20210181103
- Publication date Jun 17, 2021
- ASAHI KASEI MICRODEVICES CORPORATION
- Takaaki FURUYA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS
- Publication number 20210131963
- Publication date May 6, 2021
- ASAHI KASEI MICRODEVICES CORPORATION
- Tatsushi YAGI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS
- Publication number 20210088440
- Publication date Mar 25, 2021
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro SAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DENSITY MEASURING APPARATUS AND OPTICAL WAVEGUIDE
- Publication number 20200309691
- Publication date Oct 1, 2020
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro SAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DENSITY MEASURING APPARATUS AND OPTICAL WAVEGUIDE
- Publication number 20200309696
- Publication date Oct 1, 2020
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro SAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS
- Publication number 20200158635
- Publication date May 21, 2020
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro SAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CHARACTERISTIC ADJUSTMENT CIRCUIT
- Publication number 20200152618
- Publication date May 14, 2020
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL WAVEGUIDE, OPTICAL CONCENTRATION MEASURING DEVICE, AND METH...
- Publication number 20200116631
- Publication date Apr 16, 2020
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro SAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS
- Publication number 20200072748
- Publication date Mar 5, 2020
- ASAHI KASEI MICRODEVICES CORPORATION
- Tatsushi YAGI
- G02 - OPTICS
Information Patent Application
RECTIFYING METHOD AND RECTIFYING DEVICE
- Publication number 20190252998
- Publication date Aug 15, 2019
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro SAKAMOTO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CURRENT SOURCE
- Publication number 20190243405
- Publication date Aug 8, 2019
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro SAKAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE STORAGE ELEMENT AND REFERENCE VOLTAGE GENERATION CIRCUIT
- Publication number 20180286880
- Publication date Oct 4, 2018
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro SAKAMOTO
- G04 - HOROLOGY
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20160005840
- Publication date Jan 7, 2016
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20150024564
- Publication date Jan 22, 2015
- Shogo Katsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20130341716
- Publication date Dec 26, 2013
- ASAHI KASEI MICRODEVICES CORPORATION
- Toshiro Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS

Toshiro Sakamoto

Person

Patents Grantslast 30 patents

Optical densitometer and optical waveguide

Optical waveguide and optical concentration measuring apparatus whe...

Optical chemical analysis apparatus

Optical waveguide and optical concentration measuring apparatus

Optical waveguide, optical concentration measuring device, and meth...

Optical waveguide and optical concentration measuring apparatus com...

Optical waveguide and optical concentration measuring apparatus

Optical density measuring apparatus and optical waveguide

Current source with nonvolatile storage element

Optical density measuring apparatus and optical waveguide

Temperature characteristic adjustment circuit

Optical waveguide and optical concentration measuring apparatus

Nonvolatile storage element and reference voltage generation circuit

Semiconductor device and manufacturing method of the same

Semiconductor device and method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Patents Applicationslast 30 patents

OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS

OPTICAL CHEMICAL ANALYSIS APPARATUS

OPTICAL DENSITOMETER AND OPTICAL WAVEGUIDE

OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS

OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS

OPTICAL DENSITY MEASURING APPARATUS AND OPTICAL WAVEGUIDE

OPTICAL DENSITY MEASURING APPARATUS AND OPTICAL WAVEGUIDE

OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS

TEMPERATURE CHARACTERISTIC ADJUSTMENT CIRCUIT

OPTICAL WAVEGUIDE, OPTICAL CONCENTRATION MEASURING DEVICE, AND METH...

OPTICAL WAVEGUIDE AND OPTICAL CONCENTRATION MEASURING APPARATUS

RECTIFYING METHOD AND RECTIFYING DEVICE

CURRENT SOURCE

NONVOLATILE STORAGE ELEMENT AND REFERENCE VOLTAGE GENERATION CIRCUIT

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE