Toshitada TAKEUCHI

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Patents Grantslast 30 patents

Information Patent Grant
Evolved gas analyzer and method for analyzing evolved gas
- Patent number 10,401,342
- Issue date Sep 3, 2019
- Hitachi High-Tech Science Corporation
- Hideyuki Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing evolved gas and evolved gas analyzer
- Patent number 9,899,198
- Issue date Feb 20, 2018
- Hitachi High-Tech Science Corporation
- Hideyuki Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder for X-ray analysis and jig for sample installation
- Patent number 9,683,951
- Issue date Jun 20, 2017
- Hitachi High-Tech Science Corporation
- Toshitada Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer comprising a gas blowing mechanism
- Patent number 9,400,255
- Issue date Jul 26, 2016
- Hitachi High-Tech Science Corporation
- Hiroaki Nohara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EVOLVED GAS ANALYZER AND METHOD FOR ANALYZING EVOLVED GAS
- Publication number 20170146503
- Publication date May 25, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hideyuki AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING EVOLVED GAS AND EVOLVED GAS ANALYZER
- Publication number 20170148617
- Publication date May 25, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hideyuki AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder for X-Ray Analysis and Jig for Sample Installation
- Publication number 20150226686
- Publication date Aug 13, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshitada Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Spectrometer
- Publication number 20140294143
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroaki Nohara
- G01 - MEASURING TESTING