Toshiyasu Hishii

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing semicondctor wafer
- Patent number 5,532,610
- Issue date Jul 2, 1996
- NEC Corporation
- Tohru Tsujide
- G01 - MEASURING TESTING
Information Patent Grant
Small-sized disposable pressure transducer apparatus with a tempera...
- Patent number 5,086,777
- Issue date Feb 11, 1992
- NEC Corporation
- Toshiyasu Hishii
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Integrated gas sensitive unit comprising a gas sensitive semiconduc...
- Patent number 4,377,944
- Issue date Mar 29, 1983
- Nippon Electric Co., Ltd.
- Toshiyasu Hishii
- G01 - MEASURING TESTING