Toshiyoshi WATANABE

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Silicon drift X-ray detector
- Patent number 8,648,313
- Issue date Feb 11, 2014
- Jeol Ltd.
- Toshiyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzing apparatus
- Patent number 6,052,429
- Issue date Apr 18, 2000
- DKK Corporation
- Kazunaga Ohno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Silicon Drift X-Ray Detector
- Publication number 20100163742
- Publication date Jul 1, 2010
- JEOL Ltd.
- Toshiyoshi WATANABE
- G01 - MEASURING TESTING