Toshiyuki Aritake

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Yokohama-Shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Failure detecting method, failure detecting apparatus, and semicond...
- Patent number 8,170,707
- Issue date May 1, 2012
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Grant
Linear pattern detection method and apparatus
- Patent number 8,081,814
- Issue date Dec 20, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
LINEAR PATTERN DETECTION METHOD AND APPARATUS
- Publication number 20090220142
- Publication date Sep 3, 2009
- Hiroshi MATSUSHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAILURE DETECTING METHOD, FAILURE DETECTING APPARATUS, AND SEMICOND...
- Publication number 20090117673
- Publication date May 7, 2009
- Hiroshi MATSUSHITA
- G05 - CONTROLLING REGULATING