Toshiyuki IWAHORI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample holder and charged particle beam device
- Patent number 11,538,656
- Issue date Dec 27, 2022
- Hitachi High-Tech Science Corporation
- Toshiyuki Iwahori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryostation system
- Patent number 10,658,150
- Issue date May 19, 2020
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,600,612
- Issue date Mar 24, 2020
- Hitachi High-Tech Science Corporation
- Toshiyuki Iwahori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder, member mounting device, and charged particle beam ap...
- Patent number 10,529,533
- Issue date Jan 7, 2020
- Hitachi High-Tech Science Corporation
- Toshiyuki Iwahori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,510,508
- Issue date Dec 17, 2019
- Hitachi High-Tech Science Corporation
- Toshiyuki Iwahori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample holder for charged particle...
- Patent number 10,068,745
- Issue date Sep 4, 2018
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus
- Patent number 10,056,227
- Issue date Aug 21, 2018
- Hitachi High-Tech Science Corporation
- Tsuyoshi Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder and focused ion beam apparatus
- Patent number 9,947,506
- Issue date Apr 17, 2018
- Hitachi High-Tech Science Corporation
- Toshiyuki Iwahori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample carrying device and vacuum apparatus
- Patent number 9,885,639
- Issue date Feb 6, 2018
- Hitachi High-Tech Science Corporation
- Masakatsu Hasuda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE HOLDER AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20210090848
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki IWAHORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20180277333
- Publication date Sep 27, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki IWAHORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20180277332
- Publication date Sep 27, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki IWAHORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, MEMBER MOUNTING DEVICE, AND CHARGED PARTICLE BEAM AP...
- Publication number 20180277336
- Publication date Sep 27, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki IWAHORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER AND FOCUSED ION BEAM APPARATUS
- Publication number 20170278667
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki IWAHORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM APPARATUS
- Publication number 20170271122
- Publication date Sep 21, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tsuyoshi OONISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cryostation System
- Publication number 20170213693
- Publication date Jul 27, 2017
- Hitachi High-Technologies Corporation
- Yasuhira NAGAKUBO
- G01 - MEASURING TESTING
Information Patent Application
TRANSPORT DEVICE, TREATMENT DEVICE, VACUUM DEVICE, AND CHARGED PART...
- Publication number 20170062174
- Publication date Mar 2, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki Iwahori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE CARRYING DEVICE AND VACUUM APPARATUS
- Publication number 20160223434
- Publication date Aug 4, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masakatsu HASUDA
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device and Sample Holder for Charged Particle...
- Publication number 20160217971
- Publication date Jul 28, 2016
- Hitachi High-Technologies Corporation
- Toshie YAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS

Toshiyuki IWAHORI

Person

Patents Grantslast 30 patents

Sample holder and charged particle beam device

Cryostation system

Charged particle beam apparatus

Sample holder, member mounting device, and charged particle beam ap...

Charged particle beam apparatus

Charged particle beam device and sample holder for charged particle...

Focused ion beam apparatus

Sample holder and focused ion beam apparatus

Sample carrying device and vacuum apparatus

Patents Applicationslast 30 patents

SAMPLE HOLDER AND CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

SAMPLE HOLDER, MEMBER MOUNTING DEVICE, AND CHARGED PARTICLE BEAM AP...

SAMPLE HOLDER AND FOCUSED ION BEAM APPARATUS

FOCUSED ION BEAM APPARATUS

Cryostation System

TRANSPORT DEVICE, TREATMENT DEVICE, VACUUM DEVICE, AND CHARGED PART...

SAMPLE CARRYING DEVICE AND VACUUM APPARATUS

Charged Particle Beam Device and Sample Holder for Charged Particle...