Toshiyuki KIYOKAWA

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test carrier and carrier assembling apparatus
- Patent number 12,140,610
- Issue date Nov 12, 2024
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Test carrier and carrier assembling apparatus
- Patent number 11,906,548
- Issue date Feb 20, 2024
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Test carrier
- Patent number 11,693,026
- Issue date Jul 4, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Test carrier and electronic component testing apparatus
- Patent number 11,579,187
- Issue date Feb 14, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Test carrier and carrier assembling apparatus
- Patent number 11,531,043
- Issue date Dec 20, 2022
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device handling apparatus and electronic device testing...
- Patent number 9,588,142
- Issue date Mar 7, 2017
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer test apparatus
- Patent number 9,121,901
- Issue date Sep 1, 2015
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Wafer tray and test apparatus
- Patent number 8,513,962
- Issue date Aug 20, 2013
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, test method and computer readable medium
- Patent number 8,493,083
- Issue date Jul 23, 2013
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 8,299,935
- Issue date Oct 30, 2012
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Electronic part test apparatus
- Patent number 7,298,156
- Issue date Nov 20, 2007
- Advantest Corporation
- Hiroshi Okuda
- G01 - MEASURING TESTING
Information Patent Grant
Contact arm and electronic device testing apparatus using the same
- Patent number 6,590,383
- Issue date Jul 8, 2003
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Contact arm and electronic device testing apparatus using the same
- Patent number 6,456,062
- Issue date Sep 24, 2002
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Electric device testing apparatus
- Patent number 6,445,203
- Issue date Sep 3, 2002
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
IC chip tester with heating element for preventing condensation
- Patent number 6,313,653
- Issue date Nov 6, 2001
- Advantest Corporation
- Hiroyuki Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
IC module insert
- Patent number D442568
- Issue date May 22, 2001
- Advantest Corporation
- Yoshiyuki Masuo
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Device for detecting proper mounting of an IC for testing in an IC...
- Patent number 6,218,849
- Issue date Apr 17, 2001
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device transporting and handling apparatus
- Patent number 6,019,564
- Issue date Feb 1, 2000
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit transporting apparatus including a guide with an...
- Patent number 5,920,192
- Issue date Jul 6, 1999
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device transport system with deformed tray compensation
- Patent number 5,812,409
- Issue date Sep 22, 1998
- Advantest Corporation
- Yukio Kanno
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test section for use in an IC handler
- Patent number 5,742,168
- Issue date Apr 21, 1998
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Tray installation rack for test handler
- Patent number 5,722,514
- Issue date Mar 3, 1998
- Advantest Corp.
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
IC test equipment
- Patent number 5,177,435
- Issue date Jan 5, 1993
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
IC test equipment
- Patent number 5,172,049
- Issue date Dec 15, 1992
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST CARRIER
- Publication number 20230131189
- Publication date Apr 27, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER AND ELECTRONIC COMPONENT TESTING APPARATUS
- Publication number 20230023699
- Publication date Jan 26, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER AND CARRIER ASSEMBLING APPARATUS
- Publication number 20220011342
- Publication date Jan 13, 2022
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER AND CARRIER ASSEMBLING APPARATUS
- Publication number 20220011340
- Publication date Jan 13, 2022
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER AND CARRIER ASSEMBLING APPARATUS
- Publication number 20220011341
- Publication date Jan 13, 2022
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER AND CARRIER ASSEMBLING APPARATUS
- Publication number 20220011343
- Publication date Jan 13, 2022
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER AND CARRIER ASSEMBLING APPARATUS
- Publication number 20190346482
- Publication date Nov 14, 2019
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE HANDLING APPARATUS AND ELECTRONIC DEVICE TESTING...
- Publication number 20160116503
- Publication date Apr 28, 2016
- Advantest Corporation
- Toshiyuki KIYOKAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER TEST APPARATUS
- Publication number 20110316571
- Publication date Dec 29, 2011
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110298630
- Publication date Dec 8, 2011
- Advantest Corporation
- Toshiyuki KIYOKAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD AND COMPUTER READABLE MEDIUM
- Publication number 20110128024
- Publication date Jun 2, 2011
- Advantest Corporation
- Toshiyuki KIYOKAWA
- G01 - MEASURING TESTING
Information Patent Application
WAFER TRAY AND TEST APPARATUS
- Publication number 20110043237
- Publication date Feb 24, 2011
- Advantest Corporation
- Toshiyuki KIYOKAWA
- G01 - MEASURING TESTING
Information Patent Application
Image sensor test apparatus
- Publication number 20070159532
- Publication date Jul 12, 2007
- Advantest Corporation
- Toshiyuki Kiyokawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electronic part test apparatus
- Publication number 20050151551
- Publication date Jul 14, 2005
- Advantest Corporation
- Hiroshi Okuda
- G01 - MEASURING TESTING
Information Patent Application
IC chip tester with heating element for preventing condensation
- Publication number 20030122566
- Publication date Jul 3, 2003
- Advantest Corporation
- Hiroyuki Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Contact arm and electronic device testing apparatus using the same
- Publication number 20020186005
- Publication date Dec 12, 2002
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Application
IC chip tester with heating element for preventing condensation
- Publication number 20020011863
- Publication date Jan 31, 2002
- Advantest Corporation
- Hiroyuki Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Contact arm and electronic device testing apparatus using the same
- Publication number 20010054893
- Publication date Dec 27, 2001
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING

Toshiyuki KIYOKAWA

Person

Patents Grantslast 30 patents

Test carrier and carrier assembling apparatus

Test carrier and carrier assembling apparatus

Test carrier

Test carrier and electronic component testing apparatus

Test carrier and carrier assembling apparatus

Electronic device handling apparatus and electronic device testing...

Semiconductor wafer test apparatus

Wafer tray and test apparatus

Test apparatus, test method and computer readable medium

Test apparatus and test method

Electronic part test apparatus

Contact arm and electronic device testing apparatus using the same

Contact arm and electronic device testing apparatus using the same

Electric device testing apparatus

IC chip tester with heating element for preventing condensation

IC module insert

Device for detecting proper mounting of an IC for testing in an IC...

Semiconductor device transporting and handling apparatus

Integrated circuit transporting apparatus including a guide with an...

Semiconductor device transport system with deformed tray compensation

Test section for use in an IC handler

Tray installation rack for test handler

IC test equipment

IC test equipment

Patents Applicationslast 30 patents

TEST CARRIER

TEST CARRIER AND ELECTRONIC COMPONENT TESTING APPARATUS

TEST CARRIER AND CARRIER ASSEMBLING APPARATUS

TEST CARRIER AND CARRIER ASSEMBLING APPARATUS

TEST CARRIER AND CARRIER ASSEMBLING APPARATUS

TEST CARRIER AND CARRIER ASSEMBLING APPARATUS

TEST CARRIER AND CARRIER ASSEMBLING APPARATUS

ELECTRONIC DEVICE HANDLING APPARATUS AND ELECTRONIC DEVICE TESTING...

SEMICONDUCTOR WAFER TEST APPARATUS

TEST APPARATUS AND TEST METHOD

TEST APPARATUS, TEST METHOD AND COMPUTER READABLE MEDIUM

WAFER TRAY AND TEST APPARATUS

Image sensor test apparatus

Electronic part test apparatus

IC chip tester with heating element for preventing condensation

Contact arm and electronic device testing apparatus using the same

IC chip tester with heating element for preventing condensation

Contact arm and electronic device testing apparatus using the same