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Toshiyuki Kudo
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Musashino, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Electrical connecting apparatus
Patent number
11,067,602
Issue date
Jul 20, 2021
Kabushiki Kaisha Nihon Micronics
Toshiyuki Kudo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multilayer wiring board with enclosed Ur-variant dual conductive layer
Patent number
9,622,344
Issue date
Apr 11, 2017
Kabushiki Kaisha Nihon Micronics
Tatsuo Inoue
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Probe card and testing apparatus
Patent number
9,110,098
Issue date
Aug 18, 2015
Kabushiki Kaisha Nihon Micronics
Katsushi Mikuni
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing integrated circuit
Patent number
8,680,880
Issue date
Mar 25, 2014
Kabushiki Kaisha Nihon Micronics
Hidehiro Kiyofuji
G01 - MEASURING TESTING
Information
Patent Grant
Computer program and method for generating wire routing pattern
Patent number
8,365,130
Issue date
Jan 29, 2013
Micronics Japan Co., Ltd.
Katsushi Mikuni
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electronic contract safekeeping method, electronic contract verifyi...
Patent number
6,952,686
Issue date
Oct 4, 2005
Kabushiki Kaisha Toshiba
Toshiyuki Kudo
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRICAL CONNECTING APPARATUS
Publication number
20200191829
Publication date
Jun 18, 2020
KABUSHI KAISHA NIHON MICRONICS
TOSHIYUKI KUDO
G01 - MEASURING TESTING
Information
Patent Application
MULTI-LAYER WIRING BOARD AND PROCESS FOR MANUFCTURING THE SAME
Publication number
20150107884
Publication date
Apr 23, 2015
Kabushiki Kaisha Nihon Micronics
Tatsuo Inoue
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
PROBE CARD AND TESTING APPARATUS
Publication number
20140028341
Publication date
Jan 30, 2014
Katsushi MIKUNI
G01 - MEASURING TESTING
Information
Patent Application
COMPUTER PROGRAM AND METHOD FOR GENERATING WIRE ROUTING PATTERN
Publication number
20120167032
Publication date
Jun 28, 2012
Micronics Japan Co., Ltd.
Katsushi Mikuni
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT
Publication number
20100164520
Publication date
Jul 1, 2010
Kabushiki Kaisha Nihon Micronics
Hidehiro KIYOFUJI
G01 - MEASURING TESTING
Information
Patent Application
CLEANING APPARATUS FOR A PROBE
Publication number
20080280542
Publication date
Nov 13, 2008
KABUSHIKI KAISHA NIHON MICRONICS
Yuji Miyagi
B24 - GRINDING POLISHING