Toshiyuki Majima

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor failure analysis apparatus which acquires a failure o...
- Patent number 7,865,012
- Issue date Jan 4, 2011
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis apparatus, failure analysis method,...
- Patent number 7,805,691
- Issue date Sep 28, 2010
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070294053
- Publication date Dec 20, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070292018
- Publication date Dec 20, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070290696
- Publication date Dec 20, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070020781
- Publication date Jan 25, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G06 - COMPUTING CALCULATING COUNTING