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Toshiyuki Numazawa
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Ako-gun, JP
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Patents Grants
last 30 patents
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Patent Grant
Contact probe, method of manufacturing the contact probe, and devic...
Patent number
7,151,385
Issue date
Dec 19, 2006
Sumitomo Electric Industries, Ltd.
Yoshihiro Hirata
G01 - MEASURING TESTING
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Patent Grant
Method of forming a micro structure and an x-ray mask
Patent number
5,527,646
Issue date
Jun 18, 1996
Sumitomo Electric Industries, Ltd.
Seiji Ogino
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
Contact probe and method of manufacturing the same and test apparat...
Publication number
20060255815
Publication date
Nov 16, 2006
Sumitomo Electric Industries, Ltd.
Yoshihiro Hirata
G01 - MEASURING TESTING
Information
Patent Application
Optical switch
Publication number
20050025412
Publication date
Feb 3, 2005
Yoshihiro Hirata
G02 - OPTICS
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Patent Application
Contact probe, method of manufacturing the contact probe, and devic...
Publication number
20040075454
Publication date
Apr 22, 2004
Yoshihiro Hirata
G01 - MEASURING TESTING