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Toshiyuki Ohtaki

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    IC measuring device
    • Patent number 6,892,333
    • Issue date May 10, 2005
    • Ando Electric Co., Ltd.
    • Toshiyuki Ohtaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Propagation delay time measuring device
    • Patent number 5,633,709
    • Issue date May 27, 1997
    • Ando Electric Co., Ltd.
    • Toshiyuki Ohtaki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    IC measuring device
    • Publication number 20020079917
    • Publication date Jun 27, 2002
    • Toshiyuki Ohtaki
    • G01 - MEASURING TESTING