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Toshiyuki Ohyagi
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Mito, JP
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last 30 patents
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Patent Grant
Method of observing a sample by a transmission electron microscope
Patent number
6,777,679
Issue date
Aug 17, 2004
Hitachi High-Technologies Corporation
Isao Nagaoki
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method of observing a sample by a transmission electron microscope
Publication number
20030183762
Publication date
Oct 2, 2003
Isao Nagaoki
G01 - MEASURING TESTING