Toshiyuki Okayasu

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and testing method
- Patent number 8,933,716
- Issue date Jan 13, 2015
- Advantest Corporation
- Masahiro Ishida
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus with voltage margin test
- Patent number 8,896,332
- Issue date Nov 25, 2014
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and manufacturing method
- Patent number 8,892,381
- Issue date Nov 18, 2014
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for digital modulated signal
- Patent number 8,754,631
- Issue date Jun 17, 2014
- Advantest Corporation
- Daisuke Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electronic device and manufacturing method
- Patent number 8,614,465
- Issue date Dec 24, 2013
- Advantest Corporation
- Daisuke Watanabe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Wafer unit for testing and test system
- Patent number 8,610,449
- Issue date Dec 17, 2013
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer, semiconductor circuit, substrate for testing a...
- Patent number 8,593,166
- Issue date Nov 26, 2013
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 8,554,514
- Issue date Oct 8, 2013
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Clock data recovery circuit and method
- Patent number 8,537,935
- Issue date Sep 17, 2013
- Advantest Corporation
- Daisuke Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus and driver circuit
- Patent number 8,502,549
- Issue date Aug 6, 2013
- Advantest Corporation
- Shoji Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Time measurement circuit
- Patent number 8,471,754
- Issue date Jun 25, 2013
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 8,473,248
- Issue date Jun 25, 2013
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test system and substrate unit for testing
- Patent number 8,466,702
- Issue date Jun 18, 2013
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Power supply stabilizing circuit, electronic device and test apparatus
- Patent number 8,466,701
- Issue date Jun 18, 2013
- Advantest Corporation
- Shoji Kojima
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Test apparatus for digital modulated signal
- Patent number 8,456,170
- Issue date Jun 4, 2013
- Advantest Corporation
- Daisuke Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring apparatus, parallel measuring apparatus, testing apparatu...
- Patent number 8,436,604
- Issue date May 7, 2013
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Noise measurement apparatus and test apparatus
- Patent number 8,390,268
- Issue date Mar 5, 2013
- Advantest Corporation
- Toshiyuki Okayasu
- G01 - MEASURING TESTING
Information Patent Grant
Timing generator
- Patent number 8,392,145
- Issue date Mar 5, 2013
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer unit for testing semiconductor chips and test system
- Patent number 8,378,700
- Issue date Feb 19, 2013
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for manufacturing substrate for testing, method for manuf...
- Patent number 8,375,340
- Issue date Feb 12, 2013
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Memory device, manufacturing method for memory device and method fo...
- Patent number 8,369,126
- Issue date Feb 5, 2013
- Advantest Corporation
- Toshiyuki Okayasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switching device and testing apparatus
- Patent number 8,362,544
- Issue date Jan 29, 2013
- Advantest Corporation
- Toshiyuki Okayasu
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device, host apparatus, communication system, and record...
- Patent number 8,301,411
- Issue date Oct 30, 2012
- Advantest Corporation
- Toshiyuki Okayasu
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and electronic device
- Patent number 8,299,810
- Issue date Oct 30, 2012
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 8,278,961
- Issue date Oct 2, 2012
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Transfer circuit, transmitter, receiver and test apparatus
- Patent number 8,278,962
- Issue date Oct 2, 2012
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and electronic device that tests a device under test
- Patent number 8,274,296
- Issue date Sep 25, 2012
- Advantest Corporation
- Masayuki Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for digital modulated signal
- Patent number 8,269,569
- Issue date Sep 18, 2012
- Advantest Corporation
- Daisuke Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Data receiving circuit
- Patent number 8,270,225
- Issue date Sep 18, 2012
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Delay circuit
- Patent number 8,269,553
- Issue date Sep 18, 2012
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20130147499
- Publication date Jun 13, 2013
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR DIGITAL MODULATED SIGNAL
- Publication number 20120319794
- Publication date Dec 20, 2012
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Application
TIMING GENERATOR
- Publication number 20120158348
- Publication date Jun 21, 2012
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20120146416
- Publication date Jun 14, 2012
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20120112783
- Publication date May 10, 2012
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
SWITCHING DEVICE AND TESTING APPARATUS
- Publication number 20110309427
- Publication date Dec 22, 2011
- Advantest Corporation
- Toshiyuki Okayasu
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE, MANUFACTURING METHOD FOR MEMORY DEVICE AND METHOD FO...
- Publication number 20110242895
- Publication date Oct 6, 2011
- Advantest Corporation
- TOSHIYUKI OKAYASU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER UNIT FOR TESTING AND TEST SYSTEM
- Publication number 20110234252
- Publication date Sep 29, 2011
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND MANUFACTURING METHOD
- Publication number 20110218752
- Publication date Sep 8, 2011
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110202296
- Publication date Aug 18, 2011
- Advantest Corporation
- KAZUHIRO YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND MANUFACTURING METHOD
- Publication number 20110193138
- Publication date Aug 11, 2011
- Advantest Corporation
- DAISUKE WATANABE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST APPARATUS AND TESTING METHOD
- Publication number 20110181308
- Publication date Jul 28, 2011
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110172957
- Publication date Jul 14, 2011
- Advantest Corporation
- KAZUHIRO YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND DRIVER CIRCUIT
- Publication number 20110163771
- Publication date Jul 7, 2011
- Advantest Corporation
- Shoji Kojima
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER, SEMICONDUCTOR CIRCUIT, SUBSTRATE FOR TESTING A...
- Publication number 20110148454
- Publication date Jun 23, 2011
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
TIME MEASUREMENT CIRCUIT
- Publication number 20110133973
- Publication date Jun 9, 2011
- Advantest Corporation
- Kazuhiro Yamamoto
- G04 - HOROLOGY
Information Patent Application
SIGNAL OUTPUT CIRCUIT, TIMING GENERATE CIRCUIT, TEST APPARATUS AND...
- Publication number 20110133748
- Publication date Jun 9, 2011
- Advantest Corporation
- Yusuke HAYASE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
WAFER FOR TESTING, TEST SYSTEM, AND SEMICONDUCTOR WAFER
- Publication number 20110128032
- Publication date Jun 2, 2011
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND SUBSTRATE UNIT FOR TESTING
- Publication number 20110128031
- Publication date Jun 2, 2011
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
WAFER UNIT FOR TESTING AND TEST SYSTEM
- Publication number 20110128027
- Publication date Jun 2, 2011
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MANUFACTURING SUBSTRATE FOR TESTING, METHOD FOR MANUF...
- Publication number 20110125308
- Publication date May 26, 2011
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS, PARALLEL MEASURING APPARATUS, TESTING APPARATU...
- Publication number 20110121815
- Publication date May 26, 2011
- Advantest Corporation
- Kazuhiro YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND ELECTRICAL DEVICE
- Publication number 20110109321
- Publication date May 12, 2011
- Advantest Corporation
- Masayuki KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20110099443
- Publication date Apr 28, 2011
- Advantest Corporation
- Masahiro ISHIDA
- G01 - MEASURING TESTING
Information Patent Application
POWER SUPPLY STABILIZING CIRCUIT, ELECTRONIC DEVICE AND TEST APPARATUS
- Publication number 20110074497
- Publication date Mar 31, 2011
- Advantest Corporation
- Shoji KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR DIGITAL MODULATED SIGNAL
- Publication number 20110057665
- Publication date Mar 10, 2011
- Advantest Corporation
- Daisuke Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS FOR DIGITAL MODULATED SIGNAL
- Publication number 20110057642
- Publication date Mar 10, 2011
- Advantest Corporation
- Daisuke Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS AND METHOD FOR MODULATED SIGNAL
- Publication number 20110054827
- Publication date Mar 3, 2011
- Advantest Corporation, a Japanese Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, DEMODULATION APPARATUS, TEST METHOD, DEMODULATION M...
- Publication number 20100327967
- Publication date Dec 30, 2010
- Advantest Corporation
- Kazuhiro YAMAMOTO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS FOR DIGITAL MODULATED SIGNAL
- Publication number 20100321127
- Publication date Dec 23, 2010
- Advantest Corporation
- Daisuke Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Toshiyuki Okayasu

Person

Patents Grantslast 30 patents

Test apparatus and testing method

Test apparatus with voltage margin test

Test apparatus and manufacturing method

Test apparatus for digital modulated signal

Electronic device and manufacturing method

Wafer unit for testing and test system

Semiconductor wafer, semiconductor circuit, substrate for testing a...

Test apparatus and test method

Clock data recovery circuit and method

Test apparatus and driver circuit

Time measurement circuit

Test apparatus and test method

Test system and substrate unit for testing

Power supply stabilizing circuit, electronic device and test apparatus

Test apparatus for digital modulated signal

Measuring apparatus, parallel measuring apparatus, testing apparatu...

Noise measurement apparatus and test apparatus

Timing generator

Wafer unit for testing semiconductor chips and test system

Apparatus for manufacturing substrate for testing, method for manuf...

Memory device, manufacturing method for memory device and method fo...

Switching device and testing apparatus

Electronic device, host apparatus, communication system, and record...

Test apparatus and electronic device

Test apparatus and test method

Transfer circuit, transmitter, receiver and test apparatus

Test apparatus and electronic device that tests a device under test

Test apparatus for digital modulated signal

Data receiving circuit

Delay circuit

Patents Applicationslast 30 patents

TEST APPARATUS AND TEST METHOD

TEST APPARATUS FOR DIGITAL MODULATED SIGNAL

TIMING GENERATOR

TEST APPARATUS

TEST APPARATUS

SWITCHING DEVICE AND TESTING APPARATUS

MEMORY DEVICE, MANUFACTURING METHOD FOR MEMORY DEVICE AND METHOD FO...

WAFER UNIT FOR TESTING AND TEST SYSTEM

TEST APPARATUS AND MANUFACTURING METHOD

TEST APPARATUS AND TEST METHOD

ELECTRONIC DEVICE AND MANUFACTURING METHOD

TEST APPARATUS AND TESTING METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND DRIVER CIRCUIT

SEMICONDUCTOR WAFER, SEMICONDUCTOR CIRCUIT, SUBSTRATE FOR TESTING A...

TIME MEASUREMENT CIRCUIT

SIGNAL OUTPUT CIRCUIT, TIMING GENERATE CIRCUIT, TEST APPARATUS AND...

WAFER FOR TESTING, TEST SYSTEM, AND SEMICONDUCTOR WAFER

TEST SYSTEM AND SUBSTRATE UNIT FOR TESTING

WAFER UNIT FOR TESTING AND TEST SYSTEM

APPARATUS FOR MANUFACTURING SUBSTRATE FOR TESTING, METHOD FOR MANUF...

MEASURING APPARATUS, PARALLEL MEASURING APPARATUS, TESTING APPARATU...

TEST APPARATUS AND ELECTRICAL DEVICE

TEST APPARATUS

POWER SUPPLY STABILIZING CIRCUIT, ELECTRONIC DEVICE AND TEST APPARATUS

TEST APPARATUS FOR DIGITAL MODULATED SIGNAL

TEST APPARATUS FOR DIGITAL MODULATED SIGNAL

TEST APPARATUS AND METHOD FOR MODULATED SIGNAL

TEST APPARATUS, DEMODULATION APPARATUS, TEST METHOD, DEMODULATION M...

TEST APPARATUS FOR DIGITAL MODULATED SIGNAL