Toshiyuki Oyagi

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Mito, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and sample observation method
- Patent number 10,083,814
- Issue date Sep 25, 2018
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 9,754,763
- Issue date Sep 5, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Oyagi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope
- Publication number 20160203943
- Publication date Jul 14, 2016
- Hitachi High-Technologies Corporation
- Toshiyuki OYAGI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Sample Observation Method
- Publication number 20160064183
- Publication date Mar 3, 2016
- Hitachi High-Technologies Corporation
- Isao NAGAOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE, AND METHOD FOR ADJUSTNG OPTICAL AXIS OF ELECTR...
- Publication number 20130062519
- Publication date Mar 14, 2013
- Toshiyuki Oyagi
- H01 - BASIC ELECTRIC ELEMENTS