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Toshiyuki Saruya
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Spectroscopic analysis device and spectroscopic analysis method
Patent number
12,050,128
Issue date
Jul 30, 2024
Yokogawa Electric Corporation
Kodai Murayama
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic analysis device, optical system, and method
Patent number
11,940,326
Issue date
Mar 26, 2024
Yokogawa Electric Corporation
Kodai Murayama
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic analysis device and operation method and non-transito...
Patent number
11,821,835
Issue date
Nov 21, 2023
Yokogawa Electric Corporation
Risa Hara
G01 - MEASURING TESTING
Information
Patent Grant
Gas analysis system and gas analysis method
Patent number
11,650,155
Issue date
May 16, 2023
Yokogawa Electric Corporation
Yuta Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Method for treating surface of diamond thin film, method for formin...
Patent number
9,373,506
Issue date
Jun 21, 2016
Yokogawa Electric Corporation
Yukihiro Shintani
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Pressure sensor and method for manufacturing pressure sensor
Patent number
7,131,337
Issue date
Nov 7, 2006
Yokogawa Electric Corporation
Satoshi Kato
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD
Publication number
20220291040
Publication date
Sep 15, 2022
YOKOGAWA ELECTRIC CORPORATION
Kodai MURAYAMA
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC ANALYSIS DEVICE, OPTICAL SYSTEM, AND METHOD
Publication number
20220065697
Publication date
Mar 3, 2022
YOKOGAWA ELECTRIC CORPORATION
Kodai Murayama
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYSIS SYSTEM AND GAS ANALYSIS METHOD
Publication number
20220034807
Publication date
Feb 3, 2022
YOKOGAWA ELECTRIC CORPORATION
Yuta Suzuki
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND OPERATION METHOD AND NON-TRANSITO...
Publication number
20210302306
Publication date
Sep 30, 2021
YOKOGAWA ELECTRIC CORPORATION
Risa Hara
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TREATING SURFACE OF DIAMOND THIN FILM, METHOD FOR FORMIN...
Publication number
20150054000
Publication date
Feb 26, 2015
Waseda University
Yukihiro SHINTANI
G01 - MEASURING TESTING
Information
Patent Application
Pressure sensor and method for manufacturing pressure sensor
Publication number
20050172723
Publication date
Aug 11, 2005
Yokogawa Electric Corporation
Satoshi Kato
G01 - MEASURING TESTING