Toshiyuki Sato

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method
- Patent number 8,588,011
- Issue date Nov 19, 2013
- Elpida Memory, Inc.
- Toshiyuki Sato
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for determining deterioration of secondary bat...
- Patent number 8,129,996
- Issue date Mar 6, 2012
- The Furukawa Electric Co., Ltd.
- Noriyasu Iwane
- G01 - MEASURING TESTING
Information Patent Grant
Remaining electrical charge/remaining capacity estimating method, b...
- Patent number 8,078,416
- Issue date Dec 13, 2011
- The Furukawa Electric Co., Ltd.
- Noriyasu Iwane
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining deterioration of secondary bat...
- Patent number 7,626,394
- Issue date Dec 1, 2009
- The Furukawa Electric Co., Ltd.
- Atsushi Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum contact printing device and exposure apparatus and original...
- Patent number 5,083,156
- Issue date Jan 21, 1992
- Dai Nippon Insatsu Kabushiki Kaisha
- Toshiyuki Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
IMAGE CARRIER UNIT AND IMAGE FORMING APPARATUS
- Publication number 20210063941
- Publication date Mar 4, 2021
- Oki Data Corporation
- Takaaki EBE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD
- Publication number 20120206982
- Publication date Aug 16, 2012
- Elpida Memory, Inc.
- Toshiyuki SATO
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING DETERIORATION OF SECONDARY BAT...
- Publication number 20100045298
- Publication date Feb 25, 2010
- The Furukawa Electric CO., LTD
- Noriyasu Iwane
- G01 - MEASURING TESTING
Information Patent Application
REMAINING ELECTRICAL CHARGE/REMAINING CAPACITY ESTIMATING METHOD, B...
- Publication number 20090030626
- Publication date Jan 29, 2009
- The Furukawa Electric Co, Ltd.
- Noriyasu Iwane
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING DETERIORATION OF SECONDARY BAT...
- Publication number 20080204031
- Publication date Aug 28, 2008
- THE FURUKAWA ELECTRIC CO., LTD.
- Noriyasu IWANE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING BATTERY STATE OF CHARGE
- Publication number 20080136378
- Publication date Jun 12, 2008
- THE FURUKAWA ELECTRIC CO., LTD.
- Fumikazu Iwahana
- G01 - MEASURING TESTING