Toshiyuki SHIMAMORI

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis system
- Patent number 11,796,553
- Issue date Oct 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Nobuhiko Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 11,199,559
- Issue date Dec 14, 2021
- HITACHI HIGH-TECH CORPORATION
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 10,495,658
- Issue date Dec 3, 2019
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,970,948
- Issue date May 15, 2018
- Hitachi High-Technologies Corporation
- Toshiyuki Shimamori
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,709,588
- Issue date Jul 18, 2017
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYSIS SYSTEM
- Publication number 20210293841
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH CORPORATION
- Nobuhiko SASAKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20200064365
- Publication date Feb 27, 2020
- Hitachi High-Technologies Corporation
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20170192027
- Publication date Jul 6, 2017
- Hitachi High-Technologies Corporation
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20160238620
- Publication date Aug 18, 2016
- Hitachi High-Technologies Corporation
- Toshiyuki SHIMAMORI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20160124010
- Publication date May 5, 2016
- Hitachi High-Technologies Corporation
- Akihisa MAKINO
- G01 - MEASURING TESTING