Toshiyuki Taniuchi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope, and method for observing measurement sample
- Patent number 11,237,121
- Issue date Feb 1, 2022
- The University of Tokyo
- Shik Shin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LASER LIGHT SOURCE AND PHOTOELECTRON MICROSCOPE
- Publication number 20220276187
- Publication date Sep 1, 2022
- THE UNIVERSITY OF TOKYO
- Shik Shin
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE, AND METHOD FOR OBSERVING MEASUREMENT SAMPLE
- Publication number 20210140901
- Publication date May 13, 2021
- THE UNIVERSITY OF TOKYO
- Shik Shin
- G01 - MEASURING TESTING
Information Patent Application
Mesoscopic Magnetic Body Having Circular Single Magnetic Domain Str...
- Publication number 20070247901
- Publication date Oct 25, 2007
- Hiroyuki Akinaga
- G11 - INFORMATION STORAGE