Toshiyuki TODOROKI

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect classifying method and optical inspection apparatus for sili...
- Patent number 9,551,672
- Issue date Jan 24, 2017
- Lasertec Corporation
- Hirokazu Seki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT CLASSIFYING METHOD AND INSPECTION APPARATUS
- Publication number 20150168311
- Publication date Jun 18, 2015
- Lasertec Corporation
- Hirokazu SEKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20110242312
- Publication date Oct 6, 2011
- Lasertec Corporation
- Hirokazu SEKI
- G06 - COMPUTING CALCULATING COUNTING