TREA

Toshiyuki Yagi

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electro-optic probe
    • Patent number 6,507,014
    • Issue date Jan 14, 2003
    • Ando Electric Co. Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe for electro-optic sampling oscilloscope
    • Patent number 6,452,378
    • Issue date Sep 17, 2002
    • Ando Electric Co., Ltd.
    • Noriyuki Toriyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Temperature-insensitive electro-optic probe
    • Patent number 6,429,669
    • Issue date Aug 6, 2002
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electro-optic probe
    • Patent number 6,410,906
    • Issue date Jun 25, 2002
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe for electro-optic sampling oscilloscope
    • Patent number 6,407,561
    • Issue date Jun 18, 2002
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electro-optical probe for oscilloscope measuring signal waveform
    • Patent number 6,369,562
    • Issue date Apr 9, 2002
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrooptic probe
    • Patent number 6,348,787
    • Issue date Feb 19, 2002
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrooptic probe
    • Patent number 6,342,783
    • Issue date Jan 29, 2002
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electro-optic probe
    • Patent number 6,337,565
    • Issue date Jan 8, 2002
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrooptic probe
    • Patent number 6,297,650
    • Issue date Oct 2, 2001
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe for electro-optic sampling oscilloscope
    • Patent number 6,288,531
    • Issue date Sep 11, 2001
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electro-optic probe
    • Patent number 6,166,845
    • Issue date Dec 26, 2000
    • Ando Electric Co., Ltd.
    • Akishige Ito
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents