Toyoharu Okumoto

Person

Katsuta, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...
- Patent number 7,186,973
- Issue date Mar 6, 2007
- Hitachi High-Technologies Corporation
- Yasushi Terui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap/time-of-flight mass spectrometer and method of measuring i...
- Patent number 7,161,141
- Issue date Jan 9, 2007
- Hitachi High-Technologies Corporation
- Tadao Mimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for analyzing mass spectrometric data
- Patent number 6,914,239
- Issue date Jul 5, 2005
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma ion source mass spectrometer
- Patent number 6,248,998
- Issue date Jun 19, 2001
- Hitachi, Ltd.
- Toyoharu Okumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer, skimmer cone assembly, skimmer cone and its manu...
- Patent number 5,793,039
- Issue date Aug 11, 1998
- Hitachi Ltd.
- Konosuke Oishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzer using plasma and analysis method using plasma, interface u...
- Patent number 5,763,877
- Issue date Jun 9, 1998
- Hitachi, Ltd.
- Konosuke Oishi
- G01 - MEASURING TESTING
Information Patent Grant
Plasma ion mass spectrometer and plasma mass spectrometry using the...
- Patent number 5,616,918
- Issue date Apr 1, 1997
- Hitachi, Ltd.
- Konosuke Oishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma mass spectrometer
- Patent number 5,308,977
- Issue date May 3, 1994
- Hitachi, Ltd.
- Konosuke Oishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for analysis of gases using plasma
- Patent number 5,252,827
- Issue date Oct 12, 1993
- Hitachi, Ltd.
- Masataka Koga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High sensitive element analyzing method and apparatus of the same
- Patent number 5,202,562
- Issue date Apr 13, 1993
- Hitachi, Ltd.
- Masataka Koga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atomic absorption spectrophotometer and electromagnetic shut-off va...
- Patent number 5,108,178
- Issue date Apr 28, 1992
- Hitachi, Ltd.
- Konosuke Oishi
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer and analyzing method
- Patent number 5,104,220
- Issue date Apr 14, 1992
- Hitachi, Ltd.
- Toyoharu Okumoto
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer
- Patent number 4,890,919
- Issue date Jan 2, 1990
- Hitachi, Ltd.
- Masamichi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer
- Patent number 4,867,562
- Issue date Sep 19, 1989
- Hitachi, Ltd.
- Konosuke Oishi
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer with furnace at pressure equal...
- Patent number 4,840,484
- Issue date Jun 20, 1989
- Hitachi, Ltd.
- Konosuke Oishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ion trap/time-of-flight mass spectrometer and method of measuring i...
- Publication number 20070069121
- Publication date Mar 29, 2007
- Hitachi High-Technologies Corporation
- Tadao Mimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...
- Publication number 20050279926
- Publication date Dec 22, 2005
- Yasushi Terui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap/time-of-flight mass spectrometer and method of measuring i...
- Publication number 20050253060
- Publication date Nov 17, 2005
- Tadao Mimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for analyzing mass spectrometric data
- Publication number 20040181347
- Publication date Sep 16, 2004
- HITACHI LTD.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS

Toyoharu Okumoto

Person

Patents Grantslast 30 patents

Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...

Ion trap/time-of-flight mass spectrometer and method of measuring i...

System for analyzing mass spectrometric data

Plasma ion source mass spectrometer

Mass spectrometer, skimmer cone assembly, skimmer cone and its manu...

Analyzer using plasma and analysis method using plasma, interface u...

Plasma ion mass spectrometer and plasma mass spectrometry using the...

Plasma mass spectrometer

Method and apparatus for analysis of gases using plasma

High sensitive element analyzing method and apparatus of the same

Atomic absorption spectrophotometer and electromagnetic shut-off va...

Atomic absorption spectrophotometer and analyzing method

Atomic absorption spectrophotometer

Atomic absorption spectrophotometer

Atomic absorption spectrophotometer with furnace at pressure equal...

Patents Applicationslast 30 patents

Ion trap/time-of-flight mass spectrometer and method of measuring i...

Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...

Ion trap/time-of-flight mass spectrometer and method of measuring i...

System for analyzing mass spectrometric data