Toyoki Kanzaki

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Particle inspection and removal apparatus and particle inspection a...
- Patent number 8,279,432
- Issue date Oct 2, 2012
- Horiba, Ltd.
- Toyoki Kanzaki
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and method
- Patent number 7,733,476
- Issue date Jun 8, 2010
- Horiba, Ltd.
- Toyoki Kanzaki
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus and method
- Patent number 7,483,128
- Issue date Jan 27, 2009
- Horiba, Ltd.
- Toyoki Kanzaki
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer with adjustable detection area
- Patent number 6,943,880
- Issue date Sep 13, 2005
- Horiba, Ltd.
- Toyoki Kanzaki
- G01 - MEASURING TESTING
Information Patent Grant
Signal process method and apparatus for defect inspection
- Patent number 5,796,475
- Issue date Aug 18, 1998
- Horiba, Ltd.
- Toyoki Kanzaki
- G01 - MEASURING TESTING
Information Patent Grant
Optical detecting system wtih self-correction
- Patent number 5,337,140
- Issue date Aug 9, 1994
- Horiba, Ltd.
- Takashi Hagiwara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE INSPECTION DEVICE AND PARTICLE INSPECTION METHOD
- Publication number 20240159686
- Publication date May 16, 2024
- Horiba, Ltd.
- Shota SOMEYA
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE INSPECTION AND REMOVAL APPARATUS AND PARTICLE INSPECTION A...
- Publication number 20100229902
- Publication date Sep 16, 2010
- Horiba, Ltd.
- Toyoki KANZAKI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND METHOD
- Publication number 20080158560
- Publication date Jul 3, 2008
- Toyoki Kanzaki
- G01 - MEASURING TESTING
Information Patent Application
Foreign matter inspection apparatus and method
- Publication number 20060001864
- Publication date Jan 5, 2006
- Toyoki Kanzaki
- G01 - MEASURING TESTING