Tracy Myers

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Clackamas, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and sample for radiation microscopy including a particle bea...
- Patent number 7,429,733
- Issue date Sep 30, 2008
- LSI Corporation
- Michael B. Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Whole-wafer photoemission analysis
- Patent number 7,245,758
- Issue date Jul 17, 2007
- LSI Corporation
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Grant
Simulated voltage contrasted image generator and comparator
- Patent number 6,951,000
- Issue date Sep 27, 2005
- LSI Logic Corporation
- Joseph Cowan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Net segment analyzer for chip CAD layout
- Patent number 6,817,004
- Issue date Nov 9, 2004
- LSI Logic Corporation
- Joseph W. Cowan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and sample for radiation microscopy including a particle bea...
- Publication number 20070152151
- Publication date Jul 5, 2007
- Michael B. Schmidt
- G01 - MEASURING TESTING
Information Patent Application
Whole-wafer photoemission analysis
- Publication number 20050041849
- Publication date Feb 24, 2005
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Application
Net segment analyzer for chip CAD layout
- Publication number 20040143809
- Publication date Jul 22, 2004
- Joseph W. Cowan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Simulated voltage contrast image generator and comparator
- Publication number 20040143803
- Publication date Jul 22, 2004
- Joseph Cowan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Anisotropic probing contactor
- Publication number 20040032271
- Publication date Feb 19, 2004
- Jeffrey E. Blackwood
- G01 - MEASURING TESTING