Travis M. Eiles

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe assembly with high bandwidth beam
- Patent number 10,163,601
- Issue date Dec 25, 2018
- Intel Corporation
- Amir Raveh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Visible laser probing for circuit debug and defect analysis
- Patent number 9,651,610
- Issue date May 16, 2017
- Intel Corporation
- Travis M. Eiles
- G01 - MEASURING TESTING
Information Patent Grant
Thermally controlled sold immersion lens fixture
- Patent number 7,660,054
- Issue date Feb 9, 2010
- Intel Corporation
- Cameron Wagner
- G02 - OPTICS
Information Patent Grant
Isolation structure configurations for modifying stresses in semico...
- Patent number 7,411,269
- Issue date Aug 12, 2008
- Intel Corporation
- Qing Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structure configurations for modifying stresses in semico...
- Patent number 7,410,858
- Issue date Aug 12, 2008
- Intel Corporation
- Qing Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device speed alteration by electron-hole pair injection and device...
- Patent number 6,882,170
- Issue date Apr 19, 2005
- Intel Corporation
- Travis Eiles
- G01 - MEASURING TESTING
Information Patent Grant
Isolation structure configurations for modifying stresses in semico...
- Patent number 6,876,053
- Issue date Apr 5, 2005
- Intel Corporation
- Qing Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device having an embedded heat slug
- Patent number 6,607,928
- Issue date Aug 19, 2003
- Intel Corporation
- Travis M. Eiles
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device having an embedded heat slug
- Patent number 6,570,247
- Issue date May 27, 2003
- Intel Corporation
- Travis M. Eiles
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor die manufacture method to limit a voltage drop on a p...
- Patent number 6,519,744
- Issue date Feb 11, 2003
- Intel Corporation
- Steven G. Seidel
- G01 - MEASURING TESTING
Information Patent Grant
MOSFET-based power supply clamps for electrostatic discharge protec...
- Patent number 5,907,464
- Issue date May 25, 1999
- Intel Corporation
- Timothy J. Maloney
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
VISIBLE LASER PROBING FOR CIRCUIT DEBUG AND DEFECT ANALYSIS
- Publication number 20150002182
- Publication date Jan 1, 2015
- Travis M. Eiles
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY CONTROLLED SOLID IMMERSION LENS FIXTURE
- Publication number 20090002855
- Publication date Jan 1, 2009
- Cameron Wagner
- G02 - OPTICS
Information Patent Application
Isolation structure configurations for modifying stresses in semico...
- Publication number 20070013023
- Publication date Jan 18, 2007
- Qing Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metrology system and method for stacked wafer alignment
- Publication number 20060249859
- Publication date Nov 9, 2006
- Travis M. Eiles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Isolation structure configurations for modifying stresses in semico...
- Publication number 20060220147
- Publication date Oct 5, 2006
- Qing Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Isolation structure configurations for modifying stresses in semico...
- Publication number 20050179109
- Publication date Aug 18, 2005
- Qing Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device speed alteration by electron-hole pair injection and device...
- Publication number 20040108868
- Publication date Jun 10, 2004
- Travis Eiles
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor die manufacture method to limit a voltage drop on a p...
- Publication number 20020073386
- Publication date Jun 13, 2002
- Steven G. Seidel
- G01 - MEASURING TESTING

Travis M. Eiles

Person

Patents Grantslast 30 patents

Probe assembly with high bandwidth beam

Visible laser probing for circuit debug and defect analysis

Thermally controlled sold immersion lens fixture

Isolation structure configurations for modifying stresses in semico...

Isolation structure configurations for modifying stresses in semico...

Device speed alteration by electron-hole pair injection and device...

Isolation structure configurations for modifying stresses in semico...

Integrated circuit device having an embedded heat slug

Integrated circuit device having an embedded heat slug

Semiconductor die manufacture method to limit a voltage drop on a p...

MOSFET-based power supply clamps for electrostatic discharge protec...

Patents Applicationslast 30 patents

VISIBLE LASER PROBING FOR CIRCUIT DEBUG AND DEFECT ANALYSIS

THERMALLY CONTROLLED SOLID IMMERSION LENS FIXTURE

Isolation structure configurations for modifying stresses in semico...

Metrology system and method for stacked wafer alignment

Isolation structure configurations for modifying stresses in semico...

Isolation structure configurations for modifying stresses in semico...

Device speed alteration by electron-hole pair injection and device...

Semiconductor die manufacture method to limit a voltage drop on a p...