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Travis S. Merrill
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Rutland, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Test structure, method and circuit for simultaneously testing time...
Patent number
8,754,655
Issue date
Jun 17, 2014
International Business Machines Corporation
David G. Brochu
G01 - MEASURING TESTING
Information
Patent Grant
Measuring bias temperature instability induced ring oscillator freq...
Patent number
8,587,383
Issue date
Nov 19, 2013
International Business Machines Corporation
David G. Brochu
G01 - MEASURING TESTING
Information
Patent Grant
IC chip stress testing
Patent number
7,512,506
Issue date
Mar 31, 2009
International Business Machines Corporation
Oliver Aubel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
MEASURING DIELECTRIC BREAKDOWN IN A DYNAMIC MODE
Publication number
20140195175
Publication date
Jul 10, 2014
International Business Machines Corporation
Eduard A. Cartier
G01 - MEASURING TESTING
Information
Patent Application
MEASURING BIAS TEMPERATURE INSTABILITY INDUCED RING OSCILLATOR FREQ...
Publication number
20130147562
Publication date
Jun 13, 2013
Internatinal Business Machines Corporation
David G. Brochu
G01 - MEASURING TESTING
Information
Patent Application
TEST STRUCTURE, METHOD AND CIRCUIT FOR SIMULTANEOUSLY TESTING TIME...
Publication number
20130038334
Publication date
Feb 14, 2013
International Business Machines Corporation
David G. Brochu
G01 - MEASURING TESTING
Information
Patent Application
Dual Stage Voltage Ramp Stress Test for Gate Dielectrics
Publication number
20120187974
Publication date
Jul 26, 2012
International Business Machines Corporation
David G. Brochu, JR.
G01 - MEASURING TESTING
Information
Patent Application
IC CHIP STRESS TESTING
Publication number
20080297188
Publication date
Dec 4, 2008
International Business Machines Corporation
Oliver Aubel
G01 - MEASURING TESTING