Trevor A. NORMAN

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for detecting defects in semiconductor systems
- Patent number 12,306,112
- Issue date May 20, 2025
- AXIOMATIQUE TECHNOLOGIES, INC.
- Trevor A. Norman
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for microscopy and spectroscopy in semicond...
- Patent number 11,448,603
- Issue date Sep 20, 2022
- Trevor A. Norman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR DETECTING DEFECTS IN SEMICONDUCTOR SYSTEMS
- Publication number 20220120698
- Publication date Apr 21, 2022
- Axiomatique Technologies, Inc.
- Trevor A. NORMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR DETECTING DEFECTS IN SEMICONDUCTOR SYSTEMS
- Publication number 20220120699
- Publication date Apr 21, 2022
- Axiomatique Technologies, Inc.
- Trevor A. NORMAN
- G01 - MEASURING TESTING